Authors
Anil K Jain, Robert PW Duin, Jianchang Mao
Publication date
2000/1/1
Journal
IEEE Transaction on Pattern Analysis and Machine Intelligence, PAMI-22
Volume
1
Pages
4-37
Description
The primary goal of pattern recognition is supervised or unsupervised classification. Among the various frameworks in which pattern recognition has been traditionally formulated, the statistical approach has been most intensively studied and used in practice. More recently, neural network techniques and methods imported from statistical learning theory have been receiving increasing attention. The design of a recognition system requires careful attention to the following issues: definition of pattern classes, sensing environment, pattern representation, feature extraction and selection, cluster analysis, classifier design and learning, selection of training and test samples, and performance evaluation. In spite of almost 50 years of research and development in this field, the general problem of recognizing complex patterns with arbitrary orientation, location, and scale remains unsolved. New and emerging applications …
Total citations
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Scholar articles
AK Jain, RPW Duin, J Mao - IEEE Transactions on pattern analysis and machine …, 2000
AK Jain, RPW Duin - IEEE Transactions on Pattern Analysis and Machine …, 2000